Web個別半導体デバイスの試験方法 : MIL-STD-750C: 著者: 日本規格協会 [訳] 著者標目: 日本規格協会: 出版地(国名コード) JP: 出版地: 東京: 出版社: 日本規格協会: 出版年月日等: … Web31 mrt. 2015 · MIL-STD-750E 1. SCOPE 1.1 Purpose. This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to …
ASSIST-QuickSearch Document Details - Defense Logistics Agency
Web3: 引线抗疲劳: 用0.5kg力对引线进行90度弯曲: 3次 WebAbstract: MIL-STD-750 METHOD 2036 175 WIV High Switching 1N4456 hp 5082 step recovery HP 5082-1006 HP STEP RECOVERY DIODES hp 1002. Text: MIL-STD-750 , … flaxseed over cereal
MIL-STD-883H BURN-IN TEST - Forward Components
WebMIL-STD-750 Method 2036 15Sec Axial Series 17 Forward Surge Test 8.3ms,Single,Half-Wave MIL-STD-750 Method 4066 5Times All Series 18 ESD Test HBM:100pF,1500 … Web29 okt. 2012 · MIL–STD–750–4 APPLICABLEDOCUMENTS 2.1 General. documentslisted individualtest methods sectiondoes includedocuments cited othersections … WebMIL-STD-750 Testing. MIL-STD 750 establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious … flax seed origin